半导体光子学与技术, 2001, 7 (3): 150, 网络出版: 2011-08-10
Parameter Test of ROIC for IRFPA Based on Virtual Instrument Technology
Parameter Test of ROIC for IRFPA Based on Virtual Instrument Technology
摘要
Abstract
The readout integrated circuit (ROIC) technology is one of the critical technologies in the research of an infrared focal plane array (IRFPA). Based on the virtual instrument technology, a system for parameter test of ROIC is developed for IRFPA. The complex programmable logic device (CPLD) is applied into the system to increase its flexibility. With high reliability and precision, along with the integrated software and hardware environment, the system can test all kinds of ROICs.
JIA Gong-xian, YUAN Xiang-hui, HUANG You-shu, LU Guo-lin. Parameter Test of ROIC for IRFPA Based on Virtual Instrument Technology[J]. 半导体光子学与技术, 2001, 7(3): 150. JIA Gong-xian, YUAN Xiang-hui, HUANG You-shu, LU Guo-lin. Parameter Test of ROIC for IRFPA Based on Virtual Instrument Technology[J]. Semiconductor Photonics and Technology, 2001, 7(3): 150.