半导体光子学与技术, 2002, 8 (1): 46, 网络出版: 2011-08-11  

Large Curved Surface Measurement

Large Curved Surface Measurement
作者单位
Graduate Dept., Changchun Institute of Optics and Fine Mechanics, Changchun 130022, CHN
摘要
Abstract
The measurement principle of large curved surface through theodolite industry survey system is introduced. Two methods are suggested with respect to the distribution range of curved surface error. The experiments show that the measurement precision can be up to 0.15 mm with relative precision of 3×10-5. Finally, something needed paying attention to and the application aspects on theodolite industry survey system are given.

WANG Jin-jiang, JIN Su-kun, DI Xu, YANG Zhi-wen. Large Curved Surface Measurement[J]. 半导体光子学与技术, 2002, 8(1): 46. WANG Jin-jiang, JIN Su-kun, DI Xu, YANG Zhi-wen. Large Curved Surface Measurement[J]. Semiconductor Photonics and Technology, 2002, 8(1): 46.

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