半导体光子学与技术, 2002, 8 (3): 190, 网络出版: 2011-08-11
Matching Investigation between Instrument Precision and Aiming Method
Matching Investigation between Instrument Precision and Aiming Method
摘要
Abstract
In the course of using precise visual instrument, aiming precision is an important parameter to analyze the measurement error. Usually, instrument calibrated error is set down as measurement error. In the paper, the precision theory of TC2003 theodolite is analyzed and some aiming experiments is done for different width line. Then, the relations between the width of line and aiming precision are shown by different aiming methods of two superposition solid lines and one line clipped by double lines. Finally, an effective method to improve aiming precision is proposed which adopts the aiming method of one line clipped by double lines.
WANG Jin-jiang, JIN Guang-yong, JIN Su-kun, YANG Zhi-wen. Matching Investigation between Instrument Precision and Aiming Method[J]. 半导体光子学与技术, 2002, 8(3): 190. WANG Jin-jiang, JIN Guang-yong, JIN Su-kun, YANG Zhi-wen. Matching Investigation between Instrument Precision and Aiming Method[J]. Semiconductor Photonics and Technology, 2002, 8(3): 190.