半导体光子学与技术, 2002, 8 (3): 190, 网络出版: 2011-08-11  

Matching Investigation between Instrument Precision and Aiming Method

Matching Investigation between Instrument Precision and Aiming Method
作者单位
Graduates Dept., Changchun Institutes of Optics and Fine Mechanics, Changchun 130022, CHN
摘要
Abstract
In the course of using precise visual instrument, aiming precision is an important parameter to analyze the measurement error. Usually, instrument calibrated error is set down as measurement error. In the paper, the precision theory of TC2003 theodolite is analyzed and some aiming experiments is done for different width line. Then, the relations between the width of line and aiming precision are shown by different aiming methods of two superposition solid lines and one line clipped by double lines. Finally, an effective method to improve aiming precision is proposed which adopts the aiming method of one line clipped by double lines.

WANG Jin-jiang, JIN Guang-yong, JIN Su-kun, YANG Zhi-wen. Matching Investigation between Instrument Precision and Aiming Method[J]. 半导体光子学与技术, 2002, 8(3): 190. WANG Jin-jiang, JIN Guang-yong, JIN Su-kun, YANG Zhi-wen. Matching Investigation between Instrument Precision and Aiming Method[J]. Semiconductor Photonics and Technology, 2002, 8(3): 190.

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!