研发了一种多通道、多功能的OLED寿命分析测试系统。该系统可以在恒定驱动电流、恒定驱动电压、恒定发光强度3种不同驱动模式下同时对512路OLED器件进行寿命测试, 并可实现对测试环境温度和湿度的控制, 控制器件老化的环境。测试系统具有高精度和宽测试范围, 操作电流范围为0.02～100 mA, 操作电压范围为0～24 V。系统采用模块化设计, 可以根据用户需求灵活地搭建512, 256, 128, 64, 32路测试系统。基于LabVIEW开发环境编写的系统软件具有非常友好的操作界面和断电自保护功能, 保证了测试的连续性。

A multi-channel OLED stress test system was designed and made. The system could simultaneously stress 512 OLED devices independently in constant current, constant voltage, or constant light intensity testing mode. The system has a wide range of testing conditions with output current from 0.02 mA to 100 mA, and output voltage from 0 to 24 V.The system adopts a modular design which could easily build 512, 256, 128, 64, 32 channels based on users needs. The application software built on LabVIEW development platform includes a user-friendly interface, and a self-protection feature from power failure, ensuring the continuity of the testing, and the safety of the data. With an environment chamber, the ambient temperature and humidity could be conveniently adjusted.