半导体光子学与技术, 2007, 13 (1): 33, 网络出版: 2011-08-18  

Intelligent Camera for Surface Defect Inspection

Intelligent Camera for Surface Defect Inspection
作者单位
1 Robotics Institute, Harbin Institute of Technology, Harbin 150080, CHN
2 Anshan University of Science and Technology, Anshan 114044, CHN
摘要
Abstract
An intelligent camera for surface defect inspection is presented which can pre-process the surface image of a rolled strip and pick defective areas out at a spead of 1 600 meters per minute. The camera is made up of a high speed line CCD, a 60 Mb/s CCD digitizer with correlated double sampling function, and a field programmable gate array(FPGA), which can quickly distinguish defective areas using a perceptron embedded in FPGA thus the data to be further processed would dramatically be reduced. Some experiments show that the camera can meet high producing speed, and reduce cost and complexity of automation surface inspection systems.

CHENG Wan-sheng, ZHAO Jie, WANG Ke-cheng. Intelligent Camera for Surface Defect Inspection[J]. 半导体光子学与技术, 2007, 13(1): 33. CHENG Wan-sheng, ZHAO Jie, WANG Ke-cheng. Intelligent Camera for Surface Defect Inspection[J]. Semiconductor Photonics and Technology, 2007, 13(1): 33.

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