半导体光子学与技术, 2007, 13 (3): 210, 网络出版: 2011-08-18  

Electrodeposition and Characterization of ZnO Thin Films

Electrodeposition and Characterization of ZnO Thin Films
作者单位
Material Physics Laboratory of Education Ministry of China, Department of Physics of Zhengzhou University, Zhengzhou 450052, CHN
摘要
Abstract
Thin films of ZnO were electrodeposited from an aqueous solution of Zn(NO3)2on indium tin oxide(ITO)2covered glass substrate. The analysis of X-ray diffraction(XRD) and scanning electron micrograph (SEM) indicated that the obtained ZnO films had a compact hexagonal wurtzite type structure with preferable (002) growth direction. A sharp near-UV emission peak located at 380 nm and a strong orange-red emission peak located at 593 nm were observed in the photoluminescence, when excited with 325 nm wavelength at room temperature. Then the prepared ZnO films were introduced as anode phosphors into the field emission test. It was found that orange-red cathode-luminescence was observed and the luminescent brightness was enhanced by annealing. When annealing temperature increased about 600℃, the photoluminescence with peak of 531 nm and the green cathode-luminescence were observed. The tests showed that the brightness of about 2×102cd/m2 was obtained at electric field of 2 V/μm for annealed sample. The results revealed that the film could be a good kind of low-voltage drived cathode-luminescence phosphor.

HUANG Yan-wei, YAO Ning, ZHANG bing-lin. Electrodeposition and Characterization of ZnO Thin Films[J]. 半导体光子学与技术, 2007, 13(3): 210. HUANG Yan-wei, YAO Ning, ZHANG bing-lin. Electrodeposition and Characterization of ZnO Thin Films[J]. Semiconductor Photonics and Technology, 2007, 13(3): 210.

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