半导体光子学与技术, 2007, 13 (4): 247, 网络出版: 2011-08-18
Calculation Model for Current-voltage Relation of Silicon Quantum-dots-based Nano-memory
Calculation Model for Current-voltage Relation of Silicon Quantum-dots-based Nano-memory
摘要
Abstract
Based on the capacitive coupling formalism, an analytic model for calculating the drain currents of the quantum-dots floating-gate memory cell is proposed. Using this model, one can calculate numerically the drain currents of linear, saturation and subthreshold regions of the device with/without charges stored on the floating dots. The read operation process of ann-channel Si quantum-dots floating-gate nano-memory cell is discussed after calculating the drain currents versus the drain to source voltages and control gate voltages in both high and low threshold states respectively.
YANG Hong-guan, DAI Da-kang, YU Biao, SHANG Lin-lin, GUO You-hong. Calculation Model for Current-voltage Relation of Silicon Quantum-dots-based Nano-memory[J]. 半导体光子学与技术, 2007, 13(4): 247. YANG Hong-guan, DAI Da-kang, YU Biao, SHANG Lin-lin, GUO You-hong. Calculation Model for Current-voltage Relation of Silicon Quantum-dots-based Nano-memory[J]. Semiconductor Photonics and Technology, 2007, 13(4): 247.