通过分析焦平面测试中各种性能参数对数据要求的特点, 提出了一种区别于传统的高效数据采集方法, 并采用ADI最新发布的16位高性能ADC, 设计了基于该方法的高效高精度采集系统.通过内嵌的“RMS硬件算法”和外部SRAM的特殊组合, 在兼容传统测试系统的同时, 大大提高了系统的测试效率.经碲镉汞(HgCdTe)型640×512(15 μm)的红外焦平面(IRFPA)联调实验验证, 采集系统本底噪声低至75 μVrms以下, 对基本参数的计算在2 s左右即可完成, 充分满足高精度高分辨IRFPA对测试系统的苛刻要求, 具有很好的应用前景.

The data requirements of all parameters on the performance test of infrared focal plane arrays (IRFPA) was analyzed, and then presented an efficient data acquisition method different from the traditional one. As a result of ADI latest high-performance 16-bit ADC and this new method, a high-efficiency high-accuracy data acquisition system was introduced. By the embedded RMS Hardware Algorithm and the particular combination of external SRAMs, this scheme is not only compatible with conventional test system, but also improves the efficiency of the test system greatly at the same time. Through experiments on HgCdTe 640×512(15 μm) IRFPA, the noise floor of the acquisition system is down to 75 μVrms and the calculation of various parameters can be completed in about 2 seconds. The data acquisition system is proved to be able to meet the demanding requirements for full IRFPA test and will have a great application prospect relatively to the traditional one.