红外, 2011, 32 (8): 12, 网络出版: 2011-08-24
电阻阵列非均匀性测试方法研究
A Non-uniformity Measurement Method for Resistor Arrays
电阻阵列 非均匀性校正 稀疏网格法 全屏测试法 点扩散函数 resistor array non-uniformity correction sparse grid flood point spread function
摘要
给出了电阻阵列非均匀性校正方法,并根据非均 匀性测试模型分析了1∶1映射下的非均匀性全屏测试方法。针对图像退化会导致边 缘效应以及收敛性变差的问题,研究了基于点扩散函数估计的全屏测试方法。仿真结果 表明,与原方法相比,该方法可以减少边缘效应的影响,并且在平滑因子较大时可以体现出更好的收敛性。
Abstract
A non-uniformity correction method for resistor arrays is given and a flood non-uniformity measurement method in the mapping ratio 1∶1 is analyzed according to the functional diagram of a non-uniformity measurement model. To improve the edge effect and non-ideal convergence due to image deterioration, a flood non-uniformity measurement method based on point spread function estimation is proposed. The simulation result shows that compared with the former method, this method can reduce the edge effect and has a better convergence when a greater smooth factor is existent.
杨春伟, 王仕成, 苏德伦, 廖守亿, 张金生. 电阻阵列非均匀性测试方法研究[J]. 红外, 2011, 32(8): 12. YANG Chun-wei, WANG Shi-cheng, SU De-lun, LIAO Shou-yi, ZHANG Jin-sheng. A Non-uniformity Measurement Method for Resistor Arrays[J]. INFRARED, 2011, 32(8): 12.