为了提高激光中心波长检测的精确度, 提出了基于正交干涉原理的静态干涉系统, 由两个相互垂直的棱镜组成产生二维平面上的光程差分布, 以面阵CCD取代线阵CCD, 对平面上的正交干涉条纹数据进行采集。 在计算分析莫尔干涉仪的光程差分布的基础上, 计算干涉图像中干涉条纹的拼接及傅氏变换等, 最终得到光谱分辨率。 由MATLAB仿真软件分析结果可知, 静态莫尔干涉系统可以产生的光程差最大为234 μm, 比等尺寸的傅里叶干涉体高约一个数量级。 实验标定用的光谱仪选用LAB SPAKR 750A型光谱仪, 针对中心波长为635 nm的半导体激光器进行测量, 结果显示中心波长位置基本一致, 但在中心波长附近的光谱细节上莫尔干涉优于传统干涉具。

To improve spectrum resolution of the traditional Fourier interferometer with the same size lens, was proposed based on orthogonal wedge Fourier interferometer system. The interferometer system gets the optical path difference by the prism of two mutually perpendicular, which can make the laser Interferences on the CCD Array. The detector use the area array CCD linear array CCD, and the system collected the interference fringes on the Two-dimensional plane. On the basis of the spectrum distribution of orthogonal inclination Moire interferometer by calculating optical path difference function, the system made the splicing of interference fringes on the area array CCD and Moire transform, finally got the spectrum resolution. The results from the MATLAB simulation software shows that the Maximum optical path difference of the orthogonal inclination Moire interferometer can be generated up to 234 μm, which is higher than the traditional Fourier interferometer about one order of magnitude, so the spectrum resolution also increased by nearly 10 times theoretical. Experimental calibration of the spectrometer with a selection of LAB SPAKR 750A-type spectrometer, measurements for the center wavelength of 635 nm semiconductor laser, the results show basically the same center wavelength position. However, the spectrum detected by orthogonal inclination Moire interferometer system near the center wavelength is better than the traditional interferometer system.