半导体光电, 2011, 32 (4): 593, 网络出版: 2011-09-09   

基于形态学和小波变换的Otsu提取缺陷

Defection Extraction Using Otsu Algorithm Based on Morphology and Wavelet Transform
作者单位
南昌航空大学 无损检测教育部重点实验室,南昌 330063
摘要
为了解决经典Otsu法对复杂图像分割的不足, 提出了一种新的分割算法来提取零件的表面缺陷, 将形态学和小波变换理论应用到Otsu算法中。该算法采用两次分割, 分别为将零件从背景中分割出来以及将缺陷从零件中分割出来。算法首先采用形态学中的顶帽变换和底帽变换相结合将零件从图像背景中分离出来, 得到目标图像; 然后选择单层小波系数分解目标图像, 再将分解后的图像进行低频重构, 去除冗余信息和噪声; 最后分别应用一维和二维Otsu算法将缺陷从低频重构后的图像中分割出来。实验证明, 所提出的算法较经典的一维和二维Otsu算法, 具有分割精度高、抗噪性能强的优点, 并且改进后的一维Otsu算法要优于改进后的二维Otsu算法。
Abstract
In order to overcome the weakness of classical Otsu algorithm in complex image segmentation, a new segmentation algorithm, which applies morphology and wavelet transform into the Otsu algorithm, is introduced to extract the surface defects, Two steps are included in this algorithm, one is the component segmentation from the background and the other one is the defect segmentation from the component. First, the target image was acquired through separating the part from background image using the morphology method. Then, the monolayer wavelet coefficient was applied to separate the target image. Third, the redundancy information in the image was removed by means of low-frequency reconstruction. Finally, the one and two dimensional Otsu algorithms were used to segment the defects from part surface separately. The experiments prove that this new algorithm has higher segmentation accuracy and better noise resistance than classical one and two dimensional Otsu. Moreover, the improved one-dimensional algorithms are superior to the two-dimensional ones.

张桂梅, 陈少平, 储珺. 基于形态学和小波变换的Otsu提取缺陷[J]. 半导体光电, 2011, 32(4): 593. ZHANG Guimei, CHEN Shaoping, CHU Jun. Defection Extraction Using Otsu Algorithm Based on Morphology and Wavelet Transform[J]. Semiconductor Optoelectronics, 2011, 32(4): 593.

本文已被 1 篇论文引用
被引统计数据来源于中国光学期刊网
引用该论文: TXT   |   EndNote

相关论文

加载中...

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!