测量红外光斑在物理上和技术上都有很重要的意义。本文介绍一种精确测量高斯光斑参数的调制盘方法,它能快速和精确的测量高斯光斑参数。假若光斑强度分布是高斯模式,当光斑扫过栅栏形调制盘时,测量频谱的峰值能精确知道高斯光斑的参数.

Measurement of IR optical spot is of great importance to physics and technology. In this paper, we present a reticle method for exactly measuring Gaussian optical spot parameter. Reticle method may be used for fast, accurate measurement of Gaussian optical spot parameter. Suppose the brightness of a spot is a Gaussian model, when optical spot scans over the bars reticle, the parameter of Gaussian optical spot can be exactly known with measuring peak value of frequency spectrum.