光学学报, 1983, 3 (6): 573, 网络出版: 2011-09-15
再论测量高斯光斑参数的调制盘方法
Re-discussion on the reticle method for measuring the parameters of Gaussian optical spot
摘要
假若光斑的强度分布是高斯模式,经扇形调制盘调制,测量主频的各次谐波振幅,能推算出高斯光斑的参数.
Abstract
Suppose a optical spot is of a Gaussian intensity distribution and is modulated by a sectored reticle, then the parameters of this optical spot can be exactly derived from measurements of the harmonic amplitude spectrum.
尹达人, 许生龙. 再论测量高斯光斑参数的调制盘方法[J]. 光学学报, 1983, 3(6): 573. YIN DAREN, XU SHENLONG. Re-discussion on the reticle method for measuring the parameters of Gaussian optical spot[J]. Acta Optica Sinica, 1983, 3(6): 573.