光学学报, 1986, 6 (10): 954, 网络出版: 2011-09-16
对两种薄膜材料构成的典型周期膜系特性的全面探讨
A comprehensive investigation on characteristics of typical periodic film systems consisting of two thin-film materials
摘要
本文全面讨论了两类由不等厚层构成的周期膜系(pq)~m与(aba)~m的特性,包括反射带的定域,反射曲线的周期性与对称性以及反射宽的宽度与高度等等.并提出了一种求反射带宽的图解法.
Abstract
A comprehensive investigation of the characteristics of two kinds of periodic film system (pq)m and (aba)m consisting of two layers with difference thicknesses is presented in this paper. The location of high reflectance zones, the periodicity and symmetry of reflectance curves, and the width and height of high reflectance zones are discussed. In addition, a graphical approach to determine the width of reflectance zones is suggested.
何兆麟, 陈惠广. 对两种薄膜材料构成的典型周期膜系特性的全面探讨[J]. 光学学报, 1986, 6(10): 954. HE ZHAOLiN, ChEn huiguang. A comprehensive investigation on characteristics of typical periodic film systems consisting of two thin-film materials[J]. Acta Optica Sinica, 1986, 6(10): 954.
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