光学学报, 1987, 7 (9): 812, 网络出版: 2011-09-20
一种简单的显微物镜波面像差测定干涉仪
A simple interferometer for testing microscopic objective wave aberrations
摘要
提出一种结构简单的显微物镜波面像差测定干涉仪。该仪器可以测定各种倍率物镜轴上、轴外多种波长的波面像差等光学性能参数。并分析了仪器的系统误差。
Abstract
We have developed a simple interferometer to test the microscopic objective. It may be used to test the on- or off-axis various wavelength wave aberrations, chromatic aberration and other optical performances of various magnification microscopic objective. We have described and discused the system errors of this instruments.
向才新, 韩昌元, 贾林贤, 王立升. 一种简单的显微物镜波面像差测定干涉仪[J]. 光学学报, 1987, 7(9): 812. XIANG CAIXIN, HAM CHANGYUAN, JIA LINXIAN, WANG LINSHENG. A simple interferometer for testing microscopic objective wave aberrations[J]. Acta Optica Sinica, 1987, 7(9): 812.