光学 精密工程, 2011, 19 (9): 2023, 网络出版: 2011-10-11
球面弯曲晶体在X射线背光成像的应用
Application of spherically bent crystal to X-ray backlight imaging experiment
摘要
基于X射线布喇格衍射理论,研制了球面弯曲晶体分析器,用于研究和诊断惯性约束聚变的聚爆靶等离子体的形状、分布及稳定性。分析器的核心器件是石英球面弯晶,弯曲晶体半径为143.3 mm。首次利用石英球面弯曲晶体进行了单色X射线背光成像实验。采用接收面积为40 mm×30 mm的磷屏成像板作为接收装置,得到了清晰的铬靶单色X射线二维背光聚焦成像。对所得实验弧矢方向区域谱线的分析显示,石英球面弯曲晶体得到的X射线背光成像的空间分辨率约为83.3 μm。实验结果表明该球面弯曲晶体适合于X射线的背光诊断研究。
Abstract
A novel spherically bent crystal analyzer was developed based on the X-ray Bragg diffraction theory to study and diagnose the distribution, stability and the shape of a plasma of pellet implosion in the Inertial Confinement Fusion (ICF). The key component of the crystal analyzer is a spherically bent α-quartz crystal with a radius of 143.3 mm. The spherically bent α-quartz crystal was used to carried out a monochromatic X-ray backlighting imaging experiment in the Research Center of Laser Fusion, China Academy of Engineering Physics(CAEP). The clear two-dimensional monochrome X-ray backlighting image of a chrome target was obtained on an imaging plane of 40 mm×30 mm. By analyzing the spectral information of a sagittal direction in the experiment, it is demonstrated that the spherically bent α-quartz crystal shows his spatial resolution to be 83.3 μm and it could be used for research of the monochromatic X-ray backlighting imaging.
刘利锋, 肖沙里, 毋玉芬, 钱家渝, 韦敏习, 陈伯伦. 球面弯曲晶体在X射线背光成像的应用[J]. 光学 精密工程, 2011, 19(9): 2023. LIU Li-feng, XIAO SHa-li, WU Yu-fen, QIAN Jia-yu, WEI Min-xi, CHEN Bo-lun. Application of spherically bent crystal to X-ray backlight imaging experiment[J]. Optics and Precision Engineering, 2011, 19(9): 2023.