光电工程, 2011, 38 (11): 136, 网络出版: 2011-11-18
KDP晶体全外围夹持方案理论分析
Theoretical Analysis of the Complete Periphery Clamp in KDP Crystals
摘要
在超大超薄 KDP晶体紧密装校过程中,由于夹持力与重力作用,导致晶体面形发生形变。本文提出了 KDP晶体全外围夹持方案,并对 KDP晶体垂直状态下的各种受力模型进行应变分析。理论分析结果表明:对称支撑与均匀施力对晶体面形影响较大;当满足对称支撑和均匀施力的情况下,上侧面四个胶钉施力小于 25 N时,能够满足在线物理实验要求。
Abstract
Owing to the effect of clamp and gravity on the large aperture KDP crystal, additional surface error would be introduced in the frequency conversion system. The method of complete periphery clamp in KDP crystals has been presented,and the theoretical model simulating the situation that KDP crystals vertically mount has been analyzed. The results show that: symmetrical sustentation and even force make the crystal surface suitable for engineering application, and the requirement of physical experiment is able to be met when the force on the 4 nails of the above profile is less than 25 N under the condition of symmetrical sustentation and even force.
熊召, 贾凯, 张彬, 崔凯洪, 徐攀, 袁晓东. KDP晶体全外围夹持方案理论分析[J]. 光电工程, 2011, 38(11): 136. XIONG Zhao, JIA Kai, ZHANG Bin, CUI Kai-hong, XU Pan, YUAN Xiao-dong. Theoretical Analysis of the Complete Periphery Clamp in KDP Crystals[J]. Opto-Electronic Engineering, 2011, 38(11): 136.