Chinese Optics Letters, 2011, 9 (12): 120002, Published Online: Dec. 15, 2011
Reflective point-dif fraction microscopic interferometer with long-term stability (Invited Paper) Download: 587次
090.2880 Holographic interferometry 180.3170 Interference microscopy 120.3180 Interferometry 120.5050 Phase measurement
Abstract
An on-axis phase-shifting reflective point-diffraction microscopic interferometer for quantitative phase microscopy based on Michelson architecture is proposed. A cube beamsplitter splits the object wave spectrum into two copies within two arms. Reference wave is rebuilt in one arm by low-pass filtering on the object wave frequency spectrum with a pinhole-mask mirror, and interferes with the object wave from the other arm. Polarization phase-shifting is performed and phase imaging on microscale specimens is implemented. The experimental results demonstrate that the proposed scheme has the advantage of long-term stability due to its quasi common-path geometry with full use of laser energy.
Rongli Guo, Baoli Yao, Peng Gao, Junwei Min, Juanjuan Zheng, Tong Ye. Reflective point-dif fraction microscopic interferometer with long-term stability (Invited Paper)[J]. Chinese Optics Letters, 2011, 9(12): 120002.