针对瞬态光谱检测中对CCD线扫描速度要求高的特点， 提出一种基于面阵CCD的瞬态光谱检测方法。 该方法通过改变面阵CCD的电荷转移方式， 以实现基于面阵CCD的高速线扫描。 为了探究此方法的可行性， 初步通过改变线阵CCD的电荷转移方式， 建立了基于线阵CCD的单点超快探测系统。 在发光二极管(light emitting diode, LED)光脉冲探测实验中， 系统分别工作在单点超快探测模式和正常模式下。 测试结果表明， 基于线阵CCD的单点超快探测方法是可行的， 单点探测速率可达20 MHz。 从而在理论上证明， 通过改变CCD电荷转移方式以实现基于面阵CCD的瞬态光谱检测也是切实可行的。

Based on the characteristic of high speed line scanning for CCD in transient spectrum detection, a method of transient spectrum detection with array CCD is presented. The high speed line scanning with array CCD was realized by changing the mode of charge transfer. In order to explore the feasibility of this method, a fast detection system of single point based on linear CCD was designed and fabricated. Seven different LED pulses were measured when the system worked at fast detection mode of single point and normal mode respectively. The results demonstrate that the method of fast detection of single point based on linear CCD is feasible, and the rate of single point detection reaches up to 20 MHz. Thus, in theory, it was proved that transient spectrum detection with array CCD by changing the mode of charge transfer is also feasible.