电光与控制, 2012, 19 (6): 84, 网络出版: 2012-06-06
用AHP方法优化电子装备测试点的BITE与ATE分配
Application of AHP in Optimization of Electronic Equipments Test Point Distribution between BITE and ATE
电子装备 故障诊断 解析冗余关系 自检设备 自动测试设备 测试资源分配 electronic equipment fault diagnosis Analytical Redundancy Relation (ARR) BuiltIn Test Equipment (BITE) Automatic Test Equipment (ATE) test resource distribution
摘要
针对故障诊断中测试冗余、测试资源分配不合理的问题,首先用解析冗余关系(ARRs)优选出测试点;分析了影响测试资源选择的因素,用层次分析法(AHP)建立了评价指标集的递阶层次结构,确定了各指标的综合权重,最后用模糊综合决策方法实现了测试点的BITE与ATE分层优化,对提高电子装备的诊断能力、降低测试费用具有指导意义。
Abstract
Aiming at the problem of test redundancy and unreasonable test resource distribution within fault diagnosisthe test points were optimized first using Analytical Redundancy Relations (ARRs).The hierarchical structure of the evaluation index set was established by adopting Analytic Hierarchy Process (AHP) after analyzing the influential factors for selecting test resourcesand the consolidated weight of each index was ascertained.The hierarchical optimization of BITE and ATE for test points was realized by using a method of fuzzy consolidated decisionmaking.The conclusion can be taken as a guidance for increasing the diagnosis capability and decreasing test cost of electronic equipment.
杜敏杰, 蔡金燕, 刘利民. 用AHP方法优化电子装备测试点的BITE与ATE分配[J]. 电光与控制, 2012, 19(6): 84. DU Minjie, CAI Jinyan, LIU Limin. Application of AHP in Optimization of Electronic Equipments Test Point Distribution between BITE and ATE[J]. Electronics Optics & Control, 2012, 19(6): 84.