为了能采用物理意义明确的函数式来表述大格式电荷耦合器件(CCD)的性能参数，直观地实现对面阵CCD辐射性能的评价，本文提出利用“辐射响应函数矩阵”概念来表述CCD每个像元的辐射性能参量。首先，分析了该矩阵各元素的物理意义，提出了对CCD每个像元的绝对辐射响应度、响应非线性度、暗噪声、信噪比以及非均匀性的描述方法。其次，对面阵CCD KAI-16000进行辐射性能检测，并利用回归分析计算出各像元的响应系数。最后，以测试结果为例，讨论和描述该矩阵的应用和结果。实验结果表明：该CCD近似成线性响应，通过矩阵函数可以计算出CCD非均匀性为3.1%，暗噪声为3.84。此方法实用，满足对大格式CCD直观表述的要求。

To describe the parameters of a big format Charge Coupled Device (CCD) by a function with definit physical meaning and to evaluate its radiation response performance directly, a concept of “radiation response function matrix” was proposed to describe the radiation response parameters of each pixel of the CCD. Firstly, by analyzing the physical concept of each element, some parameters such as absolute radiate response, nonlinearity, dark noise, Signal-to-Noise Ratio (SNR) and the non-uniformity of each pixel of the CCD were characterized by the matrix. Then, response characteristic coefficient of each pixel was obtained using the model of multiple regression analysis by a test on the area CCD KAI-16000. Finally, by taking the result for an example, application of this matrix was discussed. Experimental results show that the response of this CCD is linear, and its non-uniformity is 3.1%, dark noise is 3.84. These results demonstrate that the method is feasible and practical, and it can satisfy the requirement of the description of a big format CCD.