中国激光, 1982, 9 (8): 551, 网络出版: 2012-08-23
LPX摄谱有助于痕量分析
The higher order ion X-ray spectrum of microfilings falling onto the glass mieroballoons excited by high power laser light can be identified by T1AB X-ray crystal spectrometer, thereby it is helpful for trace analysis.
摘要
Abstract
卢仁祥, 顾援, 毛楚生. LPX摄谱有助于痕量分析[J]. 中国激光, 1982, 9(8): 551. 卢仁祥, 顾援, 毛楚生. The higher order ion X-ray spectrum of microfilings falling onto the glass mieroballoons excited by high power laser light can be identified by T1AB X-ray crystal spectrometer, thereby it is helpful for trace analysis.[J]. Chinese Journal of Lasers, 1982, 9(8): 551.
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