X光晶体本征参量的实验标定是准确鉴定X光晶体种类和品质,研制各种类型晶体谱仪,X光线谱定量测量和高分辨X光单能成像的基础.基于X射线衍射仪, 通过制作平面晶体样品架,采取控制X射线管电源、滤波片选取和厚度控制等措施, 极大地抑制了CuKβ及韧致辐射, 使X射线管光源CuKα单能化, 提出了用滤片作为光源单能化的判据.对X光线谱测量中常用的X光分光晶体季戊四醇［PET(002)］的晶格常量2d和CuKα能点的积分衍射效率Rc进行了标定方法研究, 其标定值分别为(0.874 25±0.000 42)nm和(1.759±0.024)×10－4 Rad.基于X射线衍射仪的X光晶体本征参量的精密实验标定方法既快速高效, 且十分方便和灵活.通过更换衍射仪的X射线管靶材, 采取类似方法, 可以标定其它能点的晶体积分衍射效率, 可为X光晶体的本征参量库提供更多的标定数据.

Xray crystal characteristic parameters are the bases of identification of Xray crystal species and class, kinds of Xray crystal spectrometer fabrication, Xray lines intensity quantitative measurement and Xray monochromatic image diagnosis. On the automatic Xray diffractometer (XRD), based on stability and precision control of θ and 2θ goniometer, special plane crystal holder was made. Bremsstrahlung and CuKα line were attenuated for 5 orders by 40 μmthick Nickel filter, Xray sources was to be CuKα monochromatic source, and transmission power of filter was the criterion of CuKα monochromatic source. For Xray Pentaerythritol(002) plane crystal of Crystal lattice (2d) and integral reflective coefficient (Rc) of CuKα energy were calibrated, there are 2d=(0.87 425±0.00 042)nm, Rc=(1.759±0.024)×10－4 Rad respectively. This kind of experimental method is efficient and convenient on XRD in common laboratory. On XRD, other monochromatic Xray sources can be obtained by changing the material of Xray tube, and integral reflective coefficient of different energy will be obtained by the same way.