Frontiers of Optoelectronics, 2008, 1 (1): 192, 网络出版: 2012-11-06  

Incident angle of parallel light measurements based on optical vernier principle

Incident angle of parallel light measurements based on optical vernier principle
作者单位
Department of Precision Instruments and Mechanology, Tsinghua University, Beijing 100084, China
摘要
Abstract
The incident angle of a parallel light beam is hard to measure accurately under the requirement of both high precision and large measurement range. A solution based on the optical vernier principle is presented, and a corresponding measuring device is given. Compared with the former method, the suggested apparatus realizes high accuracy in a larger measurement range. The experiments on the designed apparatus show a high precision of better than 0.02u in a measurement range of ±64° and the experimental results are in accordance with analytical results in theory. The invented apparatus can be widely used in many technical areas such as aerospace, precision measurement and automatic control.

Feifan CHEN, Zhiwei HONG. Incident angle of parallel light measurements based on optical vernier principle[J]. Frontiers of Optoelectronics, 2008, 1(1): 192. Feifan CHEN, Zhiwei HONG. Incident angle of parallel light measurements based on optical vernier principle[J]. Frontiers of Optoelectronics, 2008, 1(1): 192.

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!