Chinese Optics Letters, 2013, 11 (s1): S10302, Published Online: May. 30, 2013  

Scanning interferometric method for measuring group delay of dispersive mirrors Download: 573次

Author Affiliations
Abstract
A scanning white-light interferometer is built for precisely measuring phase properties of dispersive multilayer thin film structure with the aid of the commercial spectrometer. Combining seeking optimal function for interferogram maximas with wavelet denoising algorithm, a novel time-domain algorithm is presented which enables the direct extraction of group delay and thus obtains a remarkable decrease of noise level in group delay and group delay dispersion. The apparatus shows reasonable potential for multilayer measurement, material characterization, displacement measurement as well as profilometry.

Chengshuai Li, Weidong Shen, Yueguang Zhang, Huanhuan Fan, Xu Liu. Scanning interferometric method for measuring group delay of dispersive mirrors[J]. Chinese Optics Letters, 2013, 11(s1): S10302.

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!