光学学报, 2013, 33 (6): 0611001, 网络出版: 2013-04-28
电荷耦合器件饱和效应对PIE成像质量的影响
Influence of Charge Coupled Device Saturation on PIE Imaging
成像系统 相干衍射成像 相位恢复 显微成像 imaging systems coherent diffraction imaging phase retrieval microscopic imaging PIE PIE
摘要
在研究电荷耦合器件(CCD)饱和效应对PIE成像质量影响的基础上，提出了一种改进的重建算法。该方法可以从发生部分饱和的数据重建出准确的再现像。和现有的方法相比，此方法可以在保证分辨率不受影响的条件下，大幅度缩短数据采集时间，因此可显著降低对实验装置和样品稳定性的要求，对PIE方法的推广应用有重要的实际意义。
Abstract
Based on the analysis of the influence of the charge coupled device (CCD) saturation on the image quality of ptychographical iterative engine (PIE), an improved reconstruction algorithm is proposed to get accurate reconstruction from partially saturated data. Compared with the common algorithm, the suggested method can remarkably reduce the data acquisition time without degrading the spatial resolution of the reconstruction, so the requirement on the stability of the experimental setup and the specimen is obviously reduced, and this method is quite meaningful for a wide range of applications of PIE.
王宝升, 高淑梅, 王继成, 朱健强, 刘诚. 电荷耦合器件饱和效应对PIE成像质量的影响[J]. 光学学报, 2013, 33(6): 0611001. Wang Baosheng, Gao Shumei, Wang Jicheng, Zhu Jianqiang, Liu Cheng. Influence of Charge Coupled Device Saturation on PIE Imaging[J]. Acta Optica Sinica, 2013, 33(6): 0611001.
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