结构光三维测量广泛应用于测量物体外轮廓，但使用这种技术测量金属零部件时，会由于金属表面的局部强反射形成高光区域，这种高光致使相机饱和、信息丢失，造成条纹中心提取不准确，从而产生较大的测量误差。因此，寻找一种有效的手段来避免高光问题是非常必要的。基于结构光测量系统自身的特点，提出一种新的高光去除方法——频域滤波法。该方法将高光视作噪声，通过对比分析漫反射光条和高光光条频谱分布的不同，制作合适的滤波器以滤除高光。通过3dsmax软件仿真，模拟高光效果，测试频域滤波后的条纹中心提取精度比不滤除前提高0.8 pixel。将该方法应用于实际叶片测量中，较好地解决了其中的高光问题。仿真和实验均证明，频域滤波法可以在一定程度上降低高光对结构光条纹中心提取准确度的影响。

Three-dimensional (3D) measurement technique of structured light is widely used in objects′ outline measurement. However, when it is applied to measure mechanical components and parts, some parts of intense reflection (highlight or specular light) on the surface of metal components would form highlight area. The intense reflected light can make CCD saturate and cause the extraction of center of light stripe inaccurate, and then errors would appear in the measurement results. Thus, it is a matter of great urgency to find a way to avoid highlight. We try to use the characteristic of structured light measurement system to propose a new method of highlight removal——frequency-domain filtering. Highlight is defined as a kind of noise, and this method compares the difference between highlight frequency spectrum and diffuse light frequency spectrum to make frequency filtering, and then to remove the influence of highlight. Simulating highlight in 3dsmax software, the proposed method can get 0.8 pixel improvement in the accuracy of light stripe extraction. Results of real blade test are also provided and prove that it is a better solution in actual blade test. Both simulation and experiment confirm that the proposed method could improve the accuracy in extraction of light stripe center.