薄膜量热计是进行Z箍缩辐射总能量测量的主要手段之一，准确可信的总能量参数对Z箍缩研究具有重要意义。对薄膜量热计装置进行技术改进，采用脉冲恒流源代替脉冲恒压源驱动镍薄膜量热计，撤除了回路中的串接电阻，可直接测量薄膜探测器的电阻变化，从而有效提高了辐射总能量测量的精度，拓宽了该设备的适用范围，使其可对目前“强光一号”加速器Z箍缩实验中所有典型负载进行测量。改进后平面型铝丝阵负载实验中总能量测量的相对不确定度由49.0%降低为19.6%。与闪烁探测系统功率测量结果积分值进行了对比，二者比值在0.87~1.04之间。

The resistive bolometer is an accurate, robust, spectrally broadband technique for measuring total soft X-ray yield. By replacing the pulsed voltage driver with a pulsed current driver and removing the series-wound resistance, the change of resistance between the ends of Ni-film can be measured directly, thus the measurement precision can be promoted effectively. The applicability of this improved resistive bolometer is expanded to all typical Z-pinch loads on “Qiangguang-Ⅰ” facility. Data analysis shows that the uncertainty decreases from 49.0% to 19.6% in measuring X-ray yield generated by Al wire array Z-pinches. X-ray yield data from the resistive bolometer were compared with the ones from the X-ray power measure system. The ratios between them were between 0.87 and 1.04.