研究了透明电介质/金属(铁电)薄膜/受限原子双界面系统的缀饰选择反射(DSR)光谱。考虑了三种不同的薄膜材料：KTa0.65Nb0.35O3,Ag及Fe。当受限原子蒸气厚度与探测光的波长比L/λ=0.25、0.75时DSR为典型的对称色散曲线;L/λ=0.9时其对称性减弱, 线型表现为吸收与色散的叠加;而当L/λ=1时,DSR峰几乎消失。当薄膜为KTa0.65Nb0.35O3时,随着薄膜厚度的减小，DSR峰略有下降。当薄膜为金属材料时,DSR峰随着厚度的减小得到了很大的增强。对于理想的金属Ag薄膜,这种增强最为显著。在强耦合光的作用下，由于两个缀饰态之间的量子相干效应以及交流斯塔克分裂产生的电磁诱导反射峰具有很高的光谱分辨率(可达约10MHz)。这种电磁诱导反射峰对应的高分辨率光谱可用于表面薄膜的光学参数测量及集成光学元件的检测等领域。

Dressed selective reflection (DSR) spectra in a two-interface system of transparent-dielectric/metal (ferroelectric)-layer/confined-atoms are investigated . Three different films of KTa0.65Nb0.35O3, Ag and Fe are considered in our discussion. Symmetry dispersion DSR lines are shown for L/λ=0.25 and 0.75, where L is the thickness of the atomic vapor, and λ the wavelength of the probe field. This symmetry decreases with a combination of absorption and dispersion for L/λ=0.9, however, DSR lines almost disappear for L/λ=1. There is a slight decrease of the DSR amplitude when the thickness of KTa0.65Nb0.35O3 layer decreases. However, the DSR amplitude can be largely enhanced for metal layers, and this enhancement is the most manifest case when an ideal metal Ag layer is used. Electromagnetically induced reflection with high resolution (up to about 10 MHz) can be achieved due to the quantum interference of two dressed states and alternating current (ac) Strark splitting created by a coupling field. This high-resolution electromagnetically induced reflection dip can probably be used in the measurement of the optical parameters of surface layers, as well as the detection of optoelectronic devices in integrated optics.