Chinese Optics Letters, 2013, 11 (9): 091403, Published Online: Sep. 3, 2013  

Simulation of cross-correlation method for temporal characterization of VUV free-electron-lasers Download: 658次

Author Affiliations
Abstract
The cross-correlation method for temporal characterization is investigated using simulations of the twocolor above threshold ionization (ATI) on He induced by a vacuum ultraviolet (VUV) free-electron laser (FEL) in the presence of an infrared (IR) field. Non-linear dependencies of the sideband structure produced in the two-color ATI process are expressed as a function of IR laser intensity by considering the spatial distributions and temporal jitter of both lasers. The temporal properties of the FEL pulse can be characterized accurately using the cross-correlation method at a low IR laser intensity of ~3 \times 10^{10} W/cm2 but with low cross-correlation signals. When the dynamic range of sidebands is increased to high IR intensity, the accuracy of the cross-correlation method becomes crucially dependent on the actual nonlinear index. An approach of determining this index is proposed here to improve the accuracy of temporal characterizations.

Wenbin Li, Xiaoying Ma, Xiaoyue Yang, Zhanshan Wang. Simulation of cross-correlation method for temporal characterization of VUV free-electron-lasers[J]. Chinese Optics Letters, 2013, 11(9): 091403.

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!