液晶与显示, 2013, 28 (5): 711, 网络出版: 2013-10-24
液晶模组ESD失效分析及防护研究
TFT-LCD Module ESD Failure Analysis and Protection Research
摘要
研究了液晶模组结构与静电放电(ESD)路径间的关系, 当液晶模组受ESD冲击电荷无法顺利导出, 抗ESD能力仅有2 kV 的Driver IC便成为最容易损坏的器件, IC失效会导致液晶模组无法正常工作。实验证明, 当在ESD放电路径上特定位置增加静电保护装置, 可将瞬间的电荷浪涌导入大地以提高液晶模组抗ESD的能力。论文探讨了一种在TFT基板增加静电环设计的方法可以代替FPC增加TVS管的现有模式。
Abstract
The relationship between LCD construction and Electrostatic Discharge(ESD) path was studied. Driver IC with the 2 kV ability for ESD generally, is the most easily damaged device when LCD attacked by ESD and the ESD charge is unable to disperse. LCD module cant work properly when drive IC was damaged. It is proved that additional device for ESD protect on the path of ESD circuit can conduct instantaneous current to ground to improve the ESD resistant ability of LCD module. A new method for additional electrostatic ring design on TFT substrate can instead of adding TVS tubes on FPC circuit, and this new design can be implemented without cost up.
李卿硕, 吴倩, 王莎. 液晶模组ESD失效分析及防护研究[J]. 液晶与显示, 2013, 28(5): 711. LI Qing-shuo, WU Qian, WANG Sha. TFT-LCD Module ESD Failure Analysis and Protection Research[J]. Chinese Journal of Liquid Crystals and Displays, 2013, 28(5): 711.