光子学报, 2013, 42 (11): 1340, 网络出版: 2013-12-16   

光电系统探测能力敏感度分析方法

Sensitivity Analysis Method on Detecting Ability of Electrooptical System
作者单位
1 中国科学院光电技术研究所,成都 130033
2 中国科学院大学,北京 100049
3 西北核技术研究所,西安 710024
摘要
分析了光电系统探测能力的影响因素,建立了基于各影响因素的系统探测能力模型,提出各影响因素敏感因子概念,给出了敏感权重分析评价方法,并且实现对系统探测能力的敏感度分析.基于建立的敏感性分析方法,对光电系统进行了敏感性仿真分析,给出了各影响因子的敏感权重.结果表明:系统口径、系统焦距、大气透过率、探测信噪比阈值、探测象元大小以及成像象元数对探测能力的影响最为明显,且探测信噪比阈值、探测象元大小以及成像象元数的变化与系统探测能力的变化成反向关系;天空背景亮度、系统透过率、CCD的量子效率以及积分时间对探测能力的影响为其次,除天空背景亮度外,其他参量与探测能力均属正向变化;系统的遮拦比对探测能力的影响程度最小,且其变化与探测能力呈反向关系;各参量的敏感权重与参量关系基本固定,不随初始条件变化而变化.仿真结果验证了该敏感度分析方法具有一定的完备性与通用性,可为系统设计提供技术支持.
Abstract
Based on analysis of the influence factors on detecting ability of electrooptical system, a theory model of detecting ability on the influence factors is established, concept of sensitive factors of the detecting ability is put forward, an analysis method on weights sensitivity is given, and ration sensitivity research of the factors on the detecting ability is realized. Using the ration analysis method, the sensitivity of the electrooptical system is simulated under different initial conditions, and the sensitivity weights of the factors are gained. Results show that the diameter, focus, atmosphere transmittance, detecting SNR threshold, detecting pixel size and the imaging pixel numbers may influence detecting ability obviously, and detecting SNR threshold, detecting pixel size and the imaging pixel numbers change reversely with detecting ability; the sky background brightness, optical transmittance, quantum efficiency and integral time influence the detecting ability secondly, and mainly the sky background brightness change reversely with detecting ability; the ratio of obstruction influences the detecting ability least, changes reversely with detecting ability too; and the weights do not change on different initial conditions. The simulation results prove the completeness and generality of the sensitivity analysis method that can provide technical support for the electrooptical system design.

谭碧涛, 陈洪斌, 王群书, 关小伟. 光电系统探测能力敏感度分析方法[J]. 光子学报, 2013, 42(11): 1340. TAN Bitao, CHEN Hongbin, WANG Qunshu, GUAN Xiaowei. Sensitivity Analysis Method on Detecting Ability of Electrooptical System[J]. ACTA PHOTONICA SINICA, 2013, 42(11): 1340.

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