光学学报, 2014, 34 (2): 0231001, 网络出版: 2014-01-23
栅格式透明导电膜透光性能的表征和测试方法
Method of Characterizing and Testing the Optical Performance of Metal Grid Transparent Conductive Films
薄膜 透光性能 光电信息转换 栅格式透明导电膜 thin films transmission property optoelectronic information conversion metal grid transparent conductive film
摘要
建立了栅格式透明导电膜透光性能的表征参量和测试方法。利用电荷耦合器件(CCD)光电成像设备的响应特性,将响应信号转换为透光率信息;求解出不同尺度面元上的平均透光率,并建立栅格线的印制宽度、线边缘粗糙度和线上平均透光率等参量;结合三维图示技术,对透光膜进行了像素级微观透光性的三维显示。对三个柔印正方形栅格透明导电膜样品的测试结果表明:由所建立方法得到的透光率与紫外分光光度计测试结果误差小于1%;由测量的栅格线宽、透光率及像素级微观透光特性,能够分析样品的透光及印刷工艺特征。所建立方法能够起到较详尽分析和表征栅格式透明导电膜光学性能的作用。
Abstract
Method of characterizing and testing the optical performance of metal grid transparent conductive films (MG-TCF) has been established. Utilizing a charge coupled device (CCD) optical imaging device, light transmittance values of MG-TCF can be obtained by translating the CCD light response information into the light information. The average transmittance on different size scales, printed line width and the line edge roughness have also been established. Further more, combined with 3D graphical technique, the 3D transmittance display on pixel-level scale has been set up. The test results of three MG-TCF samples with square grids in flexographic printing show that the deviations of the light transmittance measured by an ultraviolet spectrophotometer are less than 1%. And thought the light transmittance analysis on pixel-level scale for the samples, characteristic values defined above have been calculated and used for demonstrating the sample features. Overall, the established method can characterize the MG-TCFs′ optical properties and give a more detailed analysis.
徐艳芳, 李修, 刘伟, 冉军, 李路海. 栅格式透明导电膜透光性能的表征和测试方法[J]. 光学学报, 2014, 34(2): 0231001. Xu Yanfang, Li Xiu, Liu Wei, Ran Jun, Li Luhai. Method of Characterizing and Testing the Optical Performance of Metal Grid Transparent Conductive Films[J]. Acta Optica Sinica, 2014, 34(2): 0231001.