Chinese Optics Letters, 2014, 12 (9): 092901, Published Online: Aug. 21, 2014
Calculation and analysis of Mueller matrix in light scattering detection Download: 691次
290.5880 Scattering, rough surfaces 240.5770 Roughness 290.0290 Scattering 240.0240 Optics at surfaces
Abstract
A new criterion for target detection and identification is proposed to realize metal/dielectric identification and recognition based on Mueller matrix analysis. By using randomly rough surfaces as targets, numerical calculations are used to prove the robustness and accuracy of the criterion. Moreover, to the best of our knowledge, this is the first time to successfully explain the criterion by theoretical analysis. We believe the work provides an important reference for polarization imaging in laser radar and remote sensing, and so on.
Keding Yan, Shouyu Wang, Shu Jiang, Liang Xue, Yuanyuan Song, Zhengang Yan, Zhenhua Li. Calculation and analysis of Mueller matrix in light scattering detection[J]. Chinese Optics Letters, 2014, 12(9): 092901.