量子效率是电荷耦合器件(CCD)最主要的参数之一，针对目前CCD器件量子效率定标需求，提出了一种均匀光辐射法测量CCD器件量子效率方法，并对系统的不确定度进行了评定，得到系统的扩展不确定度为3.6%。同时选用CCD器件对系统扩展不确定度进行验证。实验结果表明，在300~1100 nm波长范围内，选用的三个波长点最大的重复性为0.42%，因此说明系统的不确定度分析是合理的。该系统完全可以满足目前CCD器件量子效率测量需求,对生产厂家及使用单位具有重要的使用意义。

Quantum efficiency is one of the main parameters of charge coupled device (CCD). In view of the current demand, a method, which adopts uniform light radiation, is proposed to obtain quantum efficiency of CCD device. System uncertainty is also evaluated, and the expanded uncertainty of system is 3.6%. Meanwhile, the expanded uncertainty of system is verified with CCD device. The experiment shows that maximum repeatability of three wavelength is 0.42% between 300 nm and 1100 nm, which proves the uncertainty analysis analysis is reasonable. This system can completely meet the demand of measuring quantum efficiency of CCD at present and also has important significance for manufacturers and users.