针对传统的X射线CT系统因采用积分探测器难于鉴别材质的关键技术问题，基于MARS系统的X射线能谱CT，开展了X射线能谱K-edge特性的CT成像技术研究。通过对单一材质和混(复)合材质组成的物理模型的多个X射线能量段进行CT断层扫描，获得了材质的K-edge特性曲线，以此重建出了材质的CT图像。借助材质K-edge特性的CT断层图像，可以进行材质的鉴别分析或进行更多的材质认知信息的分析研究。与传统的X射线CT技术相比较，它可以提供更为丰富的X射线衰减信息。

The typical conventional CT system employs the digital integrating sensor, for which it is difficult to identify attenuation characteristics of different energy X-ray. This paper focuses on X-ray spectral imaging technology based on MARS X-ray spectral CT system. We scanned some singular element materials and a multi-material phantom with different energy X-ray bins, obtained some material K-edge characteristic curves, and reconstructed CT images of multi-material phantom. By means of CT images based on material K-edge characteristics, we can discriminate different materials or recognize more attenuation information of different materials. Compared to conventional X-ray CT technology, X-ray spectral CT can provide much richer attenuation information.