为获得高质量的远红外硫系玻璃, 采用传统的真空熔融淬冷法配合真空低温固化技术制备了高卤素含量的Te硫系玻璃(卤素Imax=40 at.%), 并分析了该系列Ge20Te80-xIx(x=10、15、20、25、30、35、40)硫卤玻璃样品.采用分光光度计和傅里叶红外光谱仪等光学仪器分析该玻璃的可见/近红外吸收光谱和红外透射光谱等频谱性质, 利用Raman光谱仪和X射线衍射仪分析了玻璃的内部微观结构.研究表明, 随着卤素I元素的增加, 可见/近红外吸收光谱的短波截止边持续发生蓝移, 光学带隙持续增大, 从近红外的1 μm一直到远红外波长25 μm都保持透光性;Ge20Te65I15玻璃的转变温度最大, 在138℃附近, 其红外透过率最高, 达到50%.

In order to obtain high quality far-infrared chalcogenide glasses, traditional melt-quenching method jointing with dynamic glass water removing under high temperature and raw material solidifying under vacuum evacuating process have been adopt to prepare Te chalcogenide glasses with high halogen content (halogen Imax= 40 at.%), and analyzing a series of Ge20Te80-xIx (x=10,15,20,25,30,35,40) chalcogenide glass samples. Vis-NIR absorption spectra and infrared optical transmission spectra will be acquired through using spectrophotometer and Fourier transform infrared spectroscopy instruments. Internal microstructure of the glasses is analyzed by using Raman spectroscopy and X-ray diffraction instruments. The research shows that with the increase of the halogen elements I, blue shift will occur in the visible / near-infrared absorption spectrum of short-cut edge, the optical band gap will increase gradually, and the glasses remain pervious to light from 1 μm near-infrared to 25 μm far-infrared wavelength. In addition, it is found that Ge20Te65I15 glass sample has the largest glass transition temperature near 138℃ centigrade, and the infrared transmission rate is also the highest among these glasses, up to nearly 50%.