光子学报, 2015, 44 (3): 0312001, 网络出版: 2015-04-14   

双波长剪切散斑干涉法在复合材料缺陷检测中的应用

Applied Research of Dual-wavelength Shearography for Flaw Detection of Composite Material
作者单位
齐齐哈尔大学 计算机与控制工程学院, 黑龙江 齐齐哈尔 161006
摘要
为使剪切散斑干涉能适用于物体大变形的测量, 选用双波长激光照射和彩色相机, 用傅里叶变换法对干涉图进行频谱分离, 用红色波长相位减去绿色波长相位, 得到合成波长相位, 经频域滤波和相位解包裹, 得到连续相位.理论计算表明合成波长相位条纹数是单波长相位条纹数的0.189倍.合成波长参与计算可以有效减小相位条纹密度, 解决剪切散斑干涉在物体离面位移测量中由于变形条纹过于密集而导致欠采样的问题, 同时降低对干涉条纹滤波和相位解包裹难度, 增强图像处理可靠度, 提高了测量准确度.给出了合成波长与单波长相位幅度的比较以及相同外力下二者相位条纹密度的对比, 实验验证了所提方法的有效性、准确性和可靠性, 实现了剪切散斑干涉对复合材料大变形的测量, 扩展了剪切散斑干涉工程应用的范围, 为新型剪切散斑干涉测量系统的设计提供了参考.
Abstract
A color CCD camera are adopted to make sure shearography can be applied in large deformation of objects dual-wavelength lasers illumination. By separating the spectrum in the Fourier domain, the subtraction of the red wavelength phase and the green wavelength phase yielded a new phase distribution of a synthetic wavelength. After filtering in frequency domain and phase unwrapping, the continuous phase can be gotten. The number of phase stripes of synthetic wavelength is 0.189 times smaller than that of single wavelength by theoretical derivation. Using the synthetic wavelength can reduce the phase fringe density effectively, and solve the sub-Nyquist sampling problem, which are caused by too intensive interference fringes in object′s deformation. In addition, it also reduces the difficulty of image processing in filtering and phase unwrapping, enhances the reliability of image processing, and improves the measurement accuracy. Phase comparing between synthetic wavelength and single wavelength were given. Moreover, the fringe densities of the two kinds of wavelengths at the same external force also were compared. Experiments verify the effective, accuracy, and reliable of this method. It can process the large deformation measurement of composite material and dramatically expand the measurement rang of shearography in engineering application. It also provides a reference for the designing new type system of shearography.

郭媛, 毛琦, 陈小天, 吴全, 甄伟. 双波长剪切散斑干涉法在复合材料缺陷检测中的应用[J]. 光子学报, 2015, 44(3): 0312001. GUO Yuan, MAO Qi, CHENG Xiao-tian, WU Quan, ZHEN Wei. Applied Research of Dual-wavelength Shearography for Flaw Detection of Composite Material[J]. ACTA PHOTONICA SINICA, 2015, 44(3): 0312001.

本文已被 4 篇论文引用
被引统计数据来源于中国光学期刊网
引用该论文: TXT   |   EndNote

相关论文

加载中...

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!