为了确保基于NCV门库的量子电路的正确性和有效性,给出了量子 电路故障定位树的生成算法和 量子电路黑盒检测算法来定位量子电路中的门丢失故障。该故障定位树算法去除约98%的无用输出向量, 提取输出表中有效的输入向量以及对应的故障输出向量,逐层生成故障定位树。结合量子电路黑盒检测算 法对量子电路进行故障定位时不需要访问输出表就能够有效定位量子电路中的丢失门。对benchmarks部分 电路进行实验,结果验证了该算法定位单故障门的有效性。

In order to ensure the correctness and effectiveness of quantum circuits constructed on the basis of NCV gates library, fault localization tree generating algorithm and black box testing algorithm were introduced to locate the missing-gate faults in the quantum circuits. This algorithm generates fault localization trees layer by layer by eliminating approximate 98% of inefficient output vector, and meanwhile extracting the effective input vector and the corresponding responded output from the fault output table. In quantum circuit missing-fault gates can be effectively located in the process of fault locating without an access to the output table. The results of the experiment on part of the benchmarks circuits also show the effectivity of this algorithm for fault gates locating.