量子电子学报, 2015, 32 (3): 335, 网络出版: 2015-05-29
介观LC电路中电容、电感和外源流突变所产生的量子压缩
Quantum squeezing caused by abrupt change of capacity, inductance and external current source in quantized mesoscopic LC electric circuit
量子光学 介观LC电路 数-相量子化 量子压缩 quantum optics mesoscopic LC electric circuit number-phase-difference quantization quantum squeezed
摘要
通过采用有序算符内的积分技术(IWOP技术),对介观LC电路量子化方案所得到的哈密顿量进行了分析, 探讨了该方案下LC电路电容、电感、外源流在突变时所产生的量子压缩效应。结果标明:电容突变反映在正交组q呈现压缩效应;电感突变反映在另一正交相p呈现压缩效应; 而外源流的非线性突变反映出来的是数-相压缩。
Abstract
The technique of integration within ordered product (IWOP) of operator is applied to analyze the Hamiltonian produced in the quantization scheme of the mesosopic LC electric circuit and explore the corresponding quantum squeezing effects when there is a sudden change in electrical capacity, inductance and external current. It turns out that while the sudden change of capacity results in squezzing in the quadrature q, the sudden change of inductance brings out squeezing in another quadrature p, and the nonlinear change of enternal current source reveals number-phase squeezing.
吴卫锋, 范洪义. 介观LC电路中电容、电感和外源流突变所产生的量子压缩[J]. 量子电子学报, 2015, 32(3): 335. WU Weifeng, FAN Hongyi. Quantum squeezing caused by abrupt change of capacity, inductance and external current source in quantized mesoscopic LC electric circuit[J]. Chinese Journal of Quantum Electronics, 2015, 32(3): 335.