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Multiscale analysis of single- and multiple-pulse laser-induced damages in HfO2/SiO2 multilayer dielectric films at 532 nm

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Abstract

Nanosecond single- and multiple-pulse laser damage studies on HfO2/SiO2 high-reflection (HR) coatings are performed at 532 nm. For single-pulse irradiation, the damage is attributed to the defects and the electric intensity distribution in the multilayer thin films. When the defect density in the irradiated area is high, delamination is observed. Other than the 1064 nm laser damage, the plasma scalding of the 532 nm laser damage is not pits-centered for normal incidence, and the size of the plasma scalding has no relation to the defect density and position, but increases with the laser fluence. For multiple-pulse irradiations, some damage sites show deeper precursors than those from the single-shot irradiation due to the accumulation effects. The cumulative laserinduced damages behave as pits without the presence of plasma scalding, which is unaffected by the laser fluence and shot numbers. The damage morphologies and depth information both confirm the fatigue effect of a HfO2/SiO2 HR coating under 532 nm laser irradiation.

Newport宣传-MKS新实验室计划
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DOI:10.3788/COL201513.091404

所属栏目:Lasers and laser optics

责任编辑:王晓峰

收稿日期:2015-04-24

录用日期:2015-06-30

网络出版日期:2015-08-05

作者单位    点击查看

Wenwen Liu:Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, ChinaGraduate School of Chinese Academy of Sciences, Beijing 100039, China
Chaoyang Wei:Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
Kui Yi:Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
Jianda Shao:Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

联系人作者:联系作者(siomwei@siom.ac.cn)

备注:This work was supported by the National NaturalScience Foundation of China under Grant Nos. 11104293 and 61308021.

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