设计了一种错位双光栅色散元件,与条纹相机耦合实现了0.1~5 keV范围X射线时间分辨谱的测量.该色散元件由2 000 lp/mm和5 000 lp/mm两块子光栅在空间错位排布而成,低密度光栅测量低能段软X射线(100~1 000 eV),高密度光栅测量中能段软X射线(1 000~5 000 eV),通过空间错位实现能谱拼接.在同步辐射源上使用单色能点对其进行标定,获得了错位双光栅衍射效率的实验结果.根据光栅的结构特性,结合标定结果与严格耦合波分析理论,计算得到了100~5 000 eV能区光栅的绝对衍射效率曲线,并给出了错位双光栅的解谱方法.该错位双光栅能够有效提升透射光栅谱仪的性能,为高温等离子体诊断提供宽谱X射线时间分辨谱定量测量.

A Shifted Dual Transmission Grating (SDTG) component has been designed and fabricated in this work,a range of 0.1~5keV time-resolved spectrum can be recorded when the SDTG coupled with a streak camera. This SDTG is composed of 2000 lines/mm and 5000 lines/mm sub transmission grating which shifted with a certain distance. One of this sub grating is designed to measure the soft X-ray spectrum in 100~1000eV photon energy while the other measures 1000~5000eV photon energy. This space-shifted grating can sufficiently use the limited recorded panel to obtain a spliced time-resolved spectrum in streak camera. In this paper,The SDTG component is calibrated to get the diffraction efficiencies on Beijing synchrontron radiation facility,and the related efficiencies was achived. According to the structure parameter of this grating,the absolutely diffraction efficiency value was enentually obtained in combination the experimental values with the rigorous coupled-wave anslysis,meanwhile a method is discussed to unfold the source spectrum from the obtained efficiency. This SDTG component can improve the performance of the spectrometer,and may become an outstanding device to precisely measure x-ray spectra in the diagnostics of laser-produced plasma.