为了在一次扫描质子核探针实验中能获取多种物理信息,研制了多功能信号探测与数据获取系统。系统由组合探测器、多站多参量数据采集与束流扫描、样品台控制与显微观测三个子系统组成。组合探测器包括了Si（Li）X射线探测器,高纯Ge γ射线探测器,以及Au（Si）面垒带电粒子探测器,可完成多种物理参数的同时获取。系统的核心数据采集与束流扫描系统基于NI 公司的PXI-7852R数据采集卡和LabVIEW 软件平台,具备了多个物理信号采集、多能谱显示以及束流扫描和二维成像等功能。六轴高精度真空样品台由计算机控制,可实现显微图像对样品的定位及对扫描区域的可视化选择。初步实验验证了该系统的可靠性与稳定性。

For acquiring multiple physical parameters in one experiment on the SINAP scanning proton microprobe(SPM), the new multifunction signal detection and data acquisition system was developed. The system consists of multiple detectors, multi-stations and multi-parameters data acquisition and beam scanning system, manipulator control and microscope system. Multiple detectors include two Si(Li) detectors for X-rays,a HPGe detector for gamma-rays, and Au(Si) surface barrier detectors for charged particles. The core data acquisition system, named 4LB-Ⅰis based on National Instruments PXI-7852R card and Labview FPGA module. It performs the functions of multi-channel data acquisition, display, beam scanning and two-dimensional images, which can obtain multiple physical parameters simultaneously in one measurement. Six axis vacuum manipulator is computer-controlled for sample positioning and video sample imaging. The initial experiment results show that the system is a powerful tool with good stability and reliability.