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基于AOI逻辑运算的线性方程应用

Application of linear equations based on AOI logic operation

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摘要

自动光学检测系统采用周期性比较和逻辑运算的方法获取缺陷点的信息。但由于其最小周期比较Pitch存在小数,会造成比较对象的非正确选取。利用两点一线原理,可以构建一次线性方程使原来断点模拟成连续的点,达到无论比较距离是会否为整数,都能找到相对应的灰度值的效果。利用此方法可以提高异常点检出的准确度,同时会避免对产品产量、品质及成本的不利影响,具有重要意义。

Abstract

Method for automatic optical inspection system with periodic comparison and logic operation can obtain defect point information. Because of the existence of minimal cycle comparison of Pitch decimal,we cannot get the correct comparison. The use of two points formed one line,we can construct a linear equation to simulate the original breakpoints into continuous points. Just then,whether the comparative distance is an integer,the corresponding effect is found in the gray value. Using this method to improve the accuracy of anomaly check,the adverse effect is avoided on the yield,quality and cost of the product,which has the vital significance.

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中图分类号:TH865

DOI:10.3788/yjyxs20153005.0883

所属栏目:测试技术

收稿日期:2014-12-12

修改稿日期:2015-03-28

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作者单位    点击查看

张铁轶:合肥鑫晟光电科技有限公司,安徽 合肥 230012
王 贺:合肥鑫晟光电科技有限公司,安徽 合肥 230012
龚 伟:合肥鑫晟光电科技有限公司,安徽 合肥 230012
朱 宇:合肥鑫晟光电科技有限公司,安徽 合肥 230012
方 鑫:合肥鑫晟光电科技有限公司,安徽 合肥 230012
孙广岩:合肥鑫晟光电科技有限公司,安徽 合肥 230012

联系人作者:张铁轶(zhangtieyi@boe.com.cn)

备注:张铁轶(1984-),男,安徽省亳州人,高级工程师,2007年于解放军炮兵学院获学士学位,2014年于北京航空航天大学获工程硕士学位,主要从事液晶面板行业工作。

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引用该论文

ZHANG Tie-yi,WANG He,GONG Wei,ZHU Yu,FANG Xin,SUN Guang-yan. Application of linear equations based on AOI logic operation[J]. Chinese Journal of Liquid Crystals and Displays, 2015, 30(5): 883-887

张铁轶,王 贺,龚 伟,朱 宇,方 鑫,孙广岩. 基于AOI逻辑运算的线性方程应用[J]. 液晶与显示, 2015, 30(5): 883-887

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