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光交换芯片的串扰分析与DQPSK 信号传输实验

Crosstalk Analysis of Optical Switching Chips with DQPSK Signal Transmission Experiment

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摘要

串扰和插入损耗是表征光交换芯片传输性能的重要参数。将串扰与插入损耗特性结合起来,提出一种分析光交换集成芯片串扰的理论模型,考虑了串扰对开关路由的依赖性。实验测量了基于马赫-曾德尔干涉仪(MZI)的4×4 拜尼兹结构的光交换集成芯片的串扰和插入损耗系数,以及不同开关路由状态下40 Gb/s 差分四相相移键控(DQPSK)信号的传输性能,实验结果与理论分析基本一致。根据测得的串扰和插入损耗系数,计算了16×16光交换芯片串扰范围。

Abstract

Crosstalk and insertion loss are two important parameters for optical switching integrated chips. A new theoretical model of crosstalk in optical switching integrated chips, which is dependent on insertion loss and switch routing states, is put forward. As an example, the crosstalk and insertion loss coefficients of the optical switching integrated chip consisting of Mach-Zehnder interferometer (MZI)-based 4×4 Benes structure are measured by the 40 Gb/s differential quadrature phase shift keying (DQPSK) experiment under different switch routing states. The experimental results are consistent with the theoretical analysis. The crosstalk range for the16×16 Benes-type optical switching chips is calculated according to the given crosstalk and insertion loss coefficients.

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补充资料

中图分类号:O439

DOI:10.3788/aos201636.0113001

所属栏目:集成光学

基金项目:国家863计划(2012AA011304)、国家自然科学基金(61271166)、教育部创新团队发展计划

收稿日期:2015-07-13

修改稿日期:2015-08-13

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作者单位    点击查看

赵元力:电子科技大学光纤传感与通信教育部重点实验室, 四川 成都 611731
武保剑:电子科技大学光纤传感与通信教育部重点实验室, 四川 成都 611731
廖明乐:电子科技大学光纤传感与通信教育部重点实验室, 四川 成都 611731
耿勇:电子科技大学光纤传感与通信教育部重点实验室, 四川 成都 611731
邱昆:电子科技大学光纤传感与通信教育部重点实验室, 四川 成都 611731

联系人作者:赵元力(fariszhao@163.com)

备注:赵元力(1991—),男,硕士研究生,主要从事光交换集成芯片方面的研究。

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引用该论文

Zhao Yuanli,Wu Baojian,Liao Mingle,Geng Yong,Qiu Kun. Crosstalk Analysis of Optical Switching Chips with DQPSK Signal Transmission Experiment[J]. Acta Optica Sinica, 2016, 36(1): 0113001

赵元力,武保剑,廖明乐,耿勇,邱昆. 光交换芯片的串扰分析与DQPSK 信号传输实验[J]. 光学学报, 2016, 36(1): 0113001

被引情况

【1】张金花,武保剑,邱昆. 扩张型Benes光交换芯片未满配置情形下的约束链路路由算法. 激光与光电子学进展, 2019, 56(21): 211301--1

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