光电技术应用, 2016, 31 (1): 74, 网络出版: 2016-06-06  

基于EALCD的散斑照相术物面位移测试研究

Research on Speckle Photography Based on EALCD for Surface Displacement Measurement
刘喆 1,2刘海欧 1,2
作者单位
1 长春理工大学 光电信息学院光电工程分院, 长春 130012
2 中国电子科技集团公司光电研究院, 天津 300000
摘要
为了解决全息干板使用过程中显影、定影等一系列繁琐的问题, 应用电寻址液晶(EALCD)和传统的散斑照相光路相结合, 用CCD代替底片或全息干板记录散斑图样, 用EALCD实现散斑图的再现, 所有散斑图样都由计算机存储, 这样就弥补了传统散斑照相技术的不足。对测量的基本原理、实验光路的布置进行了研究, 给出了实验结果, 记录和再现光路都是在泰曼格林光路的基础上进行修改, 整个实验过程光路结构简单, 应用的光学元器件少, 将EALCD放置在光路中的相应位置实现杨氏条纹的再现, 实验结果准确可靠、测量精度高。
Abstract
In order to solve complicated problems of the development and fixation of holographic plate, combined with electrically addressed liquid crystal display (EALCD) and conventional optical path of speckle photography, CCD is used in the recording of speckle patterns instead of negatives or holographic plate. And EALCD is used in the reconstruction of speckle patterns, all speckle patterns are stored by computer, so the deficiency of traditional speckle photography is made up. Basic principles of measurement and arrangement of optical path are researched and experimental results are given. The optical path of recording and reconstruction are all modified based on Twyman Green, not only the optical structure is simple throughout the experimental process but also the application of optical elements is less. EALCD is placed in the corresponding position of the optical path to realize the reconstruction of Young’s fringes, the experimental results are accurate, reliable and have high measuring accuracy.

刘喆, 刘海欧. 基于EALCD的散斑照相术物面位移测试研究[J]. 光电技术应用, 2016, 31(1): 74. LIU Zhe, LIU Hai-ou. Research on Speckle Photography Based on EALCD for Surface Displacement Measurement[J]. Electro-Optic Technology Application, 2016, 31(1): 74.

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