切伦科夫辐射是一种方向性极好的辐射, 其辐射能量发射方向严格地与带电粒子的运动方向相关, 辐射光携带了带电粒子的方向信息, 利用这种特性可以进行电子束发散角及其分布的测量。在基于切伦科夫辐射原理的基础上, 考虑电子与物质作用时的多重库仑散射、电离等效应, 进行了电子束发散角测量的蒙特卡罗数值模拟程序的建模工作, 并完成了理想电子束及具有发散角分布的电子束的测量技术模拟工作。大量模拟结果显示, 这种测量方法是可行的, 具有对电子束发散角分布进行直接测量的能力, 并且其测量系统结构简单。

According to the principle of Cherenkov radiation (CR), the direction of CR light is strictly defined by the direction along which the charged particle moves. This angular orientation between particle and CR light can be utilized to measure and calculate beam divergence and its distribution. With multi Coulomb scatter and ionization with target material taken into account, this paper analyzed the Cherenkov effect and its application, created the simulating model with Mont-Carlo method, developed the computing code, and simulated the process of Cherenkov effects and inverse. The simulated result shows that the electron beam divergence and its distribution can be measured based on CR with an appropriate target. Simulation work put forward the appropriate conditions for the following measuring experiments and made a good reference for future work.