基于调制度分析的光学垂直测量技术利用投影和成像共轴，可以有效地解决复杂物体和台阶状物体测量时所存在的遮挡、阴影等问题。该方法不需要截断相位计算和相位展开过程，只需解算条纹的调制度分布就能得到被测物体的三维面形，已成为广泛应用的光学三维检测方法。针对基于傅里叶变换方法的垂直扫描测量技术存在的问题，利用小波变换的局部和多分辨率特性，将小波分析技术用于调制度测量轮廓术中，提高了每个扫描位置获取单帧条纹的调制度测量的精度。推导了调制度和小波系数之间的关系，计算机模拟和实验均验证了方法的有效性。

The vertical optical measurement technique with coaxial projection and imaging optical axis based on the modulation analysis provides a means to solve the problem of shadow and occlusion for measuring the complex surface or step-like surface. Without the phase truncation calculation and phase unwrapping steps, only the modulation information is needed to reconstruct the surface of the tested object in the method, which is widely used as one of the optical three-dimensional measuring techniques. Aiming at the problem of the vertical optical measurement based on the Fourier transform analysis, this paper introduces wavelet transform in modulation measurement profilometry by using partial analysis and multi-resolution characteristics of the wavelet transform for improving the measurement precision based on single fringe analysis at every scanning position. The relationship between the wavelet coefficient and the modulation is deduced, and the computer simulation and the experiment show the validity of the method.