应用激光, 2016, 36 (4): 434, 网络出版: 2016-10-19
云纹干涉法测定1 200 ℃单晶材料弹性模量及泊松比研究
Moire Interferometer Method for Measuring Young’s Modulus and Poisson Ratio of 1 200 ℃ High-temperature
摘要
通常金属试件表面零厚度光栅在800~1 000 ℃下就发生氧化和低固溶点金属的溢出, 导致试件表面的光栅被完全覆盖, 无法继续测量。本文通过特殊的物理方法处理, 使试件表面光栅重新显现, 从而获得1 200 ℃下清晰的干涉条纹, 成功测试该温度下单晶材料的弹性模量和泊松比。
Abstract
The zero-thickness grating of the metal specimen surface will be oxidized and overflowed by lowing melting point metals from 800 to 1000 ℃. The grating will be completely covered and cannot continues to be measured, A new special physical approach was proposed to reappear the grating, then the clear interference stripes were abtained at 1200℃. Young’s modulus and Poisson’s ratio of the high temperature alloys at 1 200 ℃ could be tesed.
张宸宇, 吴琼, 董爱民. 云纹干涉法测定1 200 ℃单晶材料弹性模量及泊松比研究[J]. 应用激光, 2016, 36(4): 434. Zhang Zhenyu, Wu Qiong, Dong Aimin. Moire Interferometer Method for Measuring Young’s Modulus and Poisson Ratio of 1 200 ℃ High-temperature[J]. APPLIED LASER, 2016, 36(4): 434.