High Power Laser Science and Engineering, 2016, 4 (2): 02000e12, Published Online: Nov. 1, 2016  

Ultrafast dynamical process of Ge irradiated by the femtosecond laser pulses Download: 765次

Author Affiliations
1 Institute of Atomic and Molecular Physics, Jilin University, Changchun 130012, China
2 Jilin Provincial Key Laboratory of Applied Atomic and Molecular Spectroscopy (Jilin University), Changchun 130012, China
Abstract
The ultrafast dynamic process in semiconductor Ge irradiated by the femtosecond laser pulses is numerically simulated on the basis of van Driel system. It is found that with the increase of depth, the carrier density and lattice temperature decrease, while the carrier temperature first increases and then drops. The laser fluence has a great influence on the ultrafast dynamical process in Ge. As the laser fluence remains a constant value, though the overall evolution of the carrier density and lattice temperature is almost independent of pulse duration and laser intensity, increasing the laser intensity will be more effective than increasing the pulse duration in the generation of carriers. Irradiating the Ge sample by the femtosecond double pulses, the ultrafast dynamical process of semiconductor can be affected by the temporalinterval between the double pulses.11474129), the Research Fund for the Doctoral Program of Higher Education in China (grant no. 20130061110021) and the Project 2015091 Supported by Graduate Innovation Fund of Jilin University.

Fangjian Zhang, Shuchang Li, Anmin Chen, Yuanfei Jiang, Suyu Li, Mingxing Jin1. Ultrafast dynamical process of Ge irradiated by the femtosecond laser pulses[J]. High Power Laser Science and Engineering, 2016, 4(2): 02000e12.

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